NI Releases Automated Test Outlook 2013 Highlighting Industry's Latest Trends
Poster: SySAdmin
Posted on January 14, 2013 at 10:35:01 AM
NI Releases Automated Test Outlook 2013 Highlighting Industry's Latest Trends
News Highlights
- Automated Test Outlook 2013 examines the latest business strategies, architectures, computing, software and I/O influencing current and future electronics-based industries.
- NI draws from decades of experience in automated test to forecast trends based on its business relationships, internal expertise and third-party research.
AUSTIN, Texas, Jan. 14, 2013 /PRNewswire/ -- National Instruments (Nasdaq: NATI) today released its Automated Test Outlook 2013 highlighting the company's research into the latest test and measurement technologies and methodologies. The report examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation. Engineers and managers can use the report to take advantage of the latest strategies and best practices for optimizing any test organization.
Automated Test Outlook 2013 covers the following trends:
Test Economics: New investment models force test departments to rethink the way they measure success.
Big Analog Data: Industry leaders leverage IT infrastructures and analytic tools to make faster decisions on test data.
Software-Centric Ecosystems: Open, software-centric ecosystems greatly impact the value derived from automated test systems.
Test Software Quality: Engineers use software development best practices to ensure test system reliability for complex systems.
Moore's Law Meets RF: New technology and instrumentation platforms drive up performance and drive down the cost of RF test equipment.
The Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. With this data as its foundation, the report delivers a broad representation of the next generation of trends for meeting the business and technical challenges in test and measurement.
To view Automated Test Outlook 2013, readers can visit http://www.ni.com/ato.
Click to Tweet: Automated Test Outlook 2013 from @NIGlobal explores latest trends http://bit.ly/V1LghR
About National Instruments
Since 1976, National Instruments (http://www.ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI's graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company's long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.
National Instruments, NI and ni.com are trademarks of National Instruments. Other products and company names listed are trademarks or trade names of their respective companies.
Editor Contact: Julia Betts, (512) 683-8165
SOURCE National Instruments
Photo:http://photos.prnewswire.com/prnh/20080723/LAW030LOGO
http://photoarchive.ap.org/
National Instruments
Web Site: http://www.ni.com
News Highlights
- Automated Test Outlook 2013 examines the latest business strategies, architectures, computing, software and I/O influencing current and future electronics-based industries.
- NI draws from decades of experience in automated test to forecast trends based on its business relationships, internal expertise and third-party research.
AUSTIN, Texas, Jan. 14, 2013 /PRNewswire/ -- National Instruments (Nasdaq: NATI) today released its Automated Test Outlook 2013 highlighting the company's research into the latest test and measurement technologies and methodologies. The report examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation. Engineers and managers can use the report to take advantage of the latest strategies and best practices for optimizing any test organization.
Automated Test Outlook 2013 covers the following trends:
Test Economics: New investment models force test departments to rethink the way they measure success.
Big Analog Data: Industry leaders leverage IT infrastructures and analytic tools to make faster decisions on test data.
Software-Centric Ecosystems: Open, software-centric ecosystems greatly impact the value derived from automated test systems.
Test Software Quality: Engineers use software development best practices to ensure test system reliability for complex systems.
Moore's Law Meets RF: New technology and instrumentation platforms drive up performance and drive down the cost of RF test equipment.
The Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. With this data as its foundation, the report delivers a broad representation of the next generation of trends for meeting the business and technical challenges in test and measurement.
To view Automated Test Outlook 2013, readers can visit http://www.ni.com/ato.
Click to Tweet: Automated Test Outlook 2013 from @NIGlobal explores latest trends http://bit.ly/V1LghR
About National Instruments
Since 1976, National Instruments (http://www.ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI's graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company's long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.
National Instruments, NI and ni.com are trademarks of National Instruments. Other products and company names listed are trademarks or trade names of their respective companies.
Editor Contact: Julia Betts, (512) 683-8165
SOURCE National Instruments
Photo:http://photos.prnewswire.com/prnh/20080723/LAW030LOGO
http://photoarchive.ap.org/
National Instruments
Web Site: http://www.ni.com